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Tests of microstrip dispersion formulas

Atwater, H. A. (1988) Tests of microstrip dispersion formulas. IEEE Transactions on Microwave Theory and Techniques, 36 (3). pp. 619-621. ISSN 0018-9480. http://resolver.caltech.edu/CaltechAUTHORS:20190307-092212445

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Abstract

A set of published formulas for the frequency dependence of the microstrip effective relative dielectric constant epsilon /sub re/(f) is tested relative to an assemblage of measured data values for this quantity chosen from the literature. The RMS deviation of the predicted data obtained from the measured values ranged from 2.3% to 4.1% of the seven formulas for epsilon /sub re/(f) tested. A formula due to M. Kirschning and R.H. Jansen (see Electron. Lett., vol.18, p.272-73, 1982) showed the lowest average deviation from measured values, although the differences between the predictions of their formula and others tested are of the order of the error limits of the comparison process. It is concluded that the results indicate the suitability of relatively simple analytical expressions for the computation for microstrip dispersion.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1109/22.3561DOIArticle
ORCID:
AuthorORCID
Atwater, H. A.0000-0001-9435-0201
Additional Information:© 1988 IEEE. Manuscript received August 10, 1987; revised September 12, 1987.
Record Number:CaltechAUTHORS:20190307-092212445
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20190307-092212445
Official Citation:H. A. Atwater, "Tests of microstrip dispersion formulas," in IEEE Transactions on Microwave Theory and Techniques, vol. 36, no. 3, pp. 619-621, March 1988. doi: 10.1109/22.3561
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:93619
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:08 Mar 2019 16:05
Last Modified:08 Mar 2019 16:05

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