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Lifetime analyses of error-control coded semiconductor RAM systems

Goodman, R. M. F. and McEliece, R. J. (1982) Lifetime analyses of error-control coded semiconductor RAM systems. IEE Proceedings E Computers and Digital Techniques, 129 (3). pp. 81-85. ISSN 0143-7062. https://resolver.caltech.edu/CaltechAUTHORS:20190314-130609254

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Abstract

The paper is concerned with developing quantitative results on the lifetime of coded random-access semiconductor memory systems. Although individual RAM chips are highly reliable, when large numbers of chips are combined to form a large memory system, the reliability may not be sufficiently high for the given application. In this case, error-correction coding is used to improve the reliability and hence the lifetime of the system. Formulas are developed which will enable the system designer to calculate the improvement in lifetime (over an uncoded system) for any particular coding scheme and size of memory. This will enable the designer to see if a particular memory system gives the required reliability, in terms of hours of lifetime, for the particular application. In addition, the designer will be able to calculate the percentage of identical systems that will, on average, last a given length of time.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1049/ip-e.1982.0017DOIArticle
Additional Information:© 1982 Institution of Electrical Engineers. Paper 1633E, first received 16th March and in final form 26th August 1981. The authors would like to acknowledge partial financial support from the UK Science and Engineering Research Council and the Joint Services Electronics Program (USA), contract N00014-78-C-0424.
Funders:
Funding AgencyGrant Number
Science and Engineering Research Council (SERC)UNSPECIFIED
Joint Services Electronics ProgramN00014-78-C-0424
Subject Keywords:Codes, Computer applications, Memory systems
Issue or Number:3
Record Number:CaltechAUTHORS:20190314-130609254
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20190314-130609254
Official Citation:R. M. F. Goodman and R. J. Mceliece, "Lifetime analyses of error-control coded semiconductor RAM systems," in IEE Proceedings E - Computers and Digital Techniques, vol. 129, no. 3, pp. 81-85, May 1982. doi: 10.1049/ip-e.1982.0017
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:93818
Collection:CaltechAUTHORS
Deposited By: George Porter
Deposited On:14 Mar 2019 20:43
Last Modified:03 Oct 2019 20:58

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