CaltechAUTHORS
  A Caltech Library Service

Accelerated lifetime testing and failure analysis of quartz based GaAs planar Schottky diodes

Lin, R. and Mehdi, I. and Pease, A. and Dengler, R. and Humphrey, D. and Lee, T. and Scherer, A. and Kayali, S. (1997) Accelerated lifetime testing and failure analysis of quartz based GaAs planar Schottky diodes. In: 1997 GaAs Reliability Workshop. Proceedings. IEEE , Piscataway, NJ, pp. 19-39. ISBN 0790800640. https://resolver.caltech.edu/CaltechAUTHORS:20190319-074747345

[img] PDF - Published Version
See Usage Policy.

1632Kb

Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechAUTHORS:20190319-074747345

Abstract

Accelerated lifetime tests have been performed on integrated planar GaAs Schottky diodes that were bonded to quartz substrates upside-down with a heat-cured epoxy. Results at 175°C, 200°C, and 240°C were analyzed using the Arrhenius-lognormal model. These tests predict a room temperature MTTF of 3x10^8 hours, a value that is comparable to conventional high-frequency planar Schottky diodes. This result demonstrates that the use of an appropriate epoxy to obtain GaAs devices on quartz substrates does not significantly reduce the lifetime of the devices.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1109/gaasrw.1997.656117DOIArticle
Additional Information:© 1997 IEEE.v The authors would like to acknowledge S. Martin for help in the device fabrication, B. Fujiwara for wire bonding, and K. Evans for the SEM images. We are also grateful to Dr. Peter Siegel and Karen Lee for technical discussion and for the support of this investigation. The research described in this paper was carried out by the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration.
Funders:
Funding AgencyGrant Number
NASA/JPL/CaltechUNSPECIFIED
Record Number:CaltechAUTHORS:20190319-074747345
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20190319-074747345
Official Citation:R. Lin et al., "Accelerated lifetime testing and failure analysis of quartz based GaAs planar Schottky diodes," 1997 GaAs Reliability Workshop. Proceedings, Anaheim, CA, USA, 1997, pp. 19-39. doi: 10.1109/GAASRW.1997.656117
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:93947
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:19 Mar 2019 16:32
Last Modified:03 Oct 2019 20:59

Repository Staff Only: item control page