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Curved detectors for astronomical applications: characterization results on different samples

Lombardo, Simona and Behaghel, Thibault and Chambion, Bertrand and Caplet, Stéphane and Jahn, Wilfried and Hugot, Emmanuel and Muslimov, Eduard and Roulet, Melanie and Ferrari, Marc and Gaschet, Christophe and Henry, David (2019) Curved detectors for astronomical applications: characterization results on different samples. Applied Optics, 58 (9). pp. 2174-2182. ISSN 1559-128X. https://resolver.caltech.edu/CaltechAUTHORS:20190404-091845598

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Abstract

Due to the increasing dimension, complexity, and cost of future astronomical surveys, new technologies enabling more compact and simpler systems are required. The development of curved detectors allows enhancement of the performances of the optical system used (telescope or astronomical instrument), while keeping the system more compact. We describe here a set of five curved complementary metal-oxide semiconductor (CMOS) detectors developed within a collaboration between CEA-LETI and CNRS-LAM. These fully functional detectors 20 Mpix (CMOSIS CMV20000) have been curved to different radii of curvature and spherical shapes (both convex and concave) over a size of 24×32  mm^2. Before being able to use them for astronomical observations, we assess the impact of the curving process on their performances. We perform a full electro-optical characterization of the curved detectors, by measuring the gain, the full well capacity, the dynamic range, and the noise properties, such as dark current, readout noise, pixel-relative non-uniformity. We repeat the same process for the flat version of the same CMOS sensor, as a reference for comparison. We find no significant difference among most of the characterization values of the curved and flat samples. We obtain values of readout noise of 10e− for the curved samples compared to the 11e− of the flat sample, which provides slightly larger dynamic ranges for the curved detectors. Additionally, we measure consistently smaller values of dark current compared to the flat CMOS sensor. The curving process for the prototypes shown in this paper does not significantly impact the performances of the detectors. These results represent the first step toward their astronomical implementation.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1364/ao.58.002174DOIArticle
ORCID:
AuthorORCID
Lombardo, Simona0000-0002-2161-8104
Hugot, Emmanuel0000-0002-5879-6318
Muslimov, Eduard0000-0002-3242-9894
Henry, David0000-0002-5201-0644
Additional Information:© 2019 Optical Society of America. Received 26 September 2018; revised 4 February 2019; accepted 7 February 2019; posted 8 February 2019 (Doc. ID 346854); published 13 March 2019. Funding: H2020 European Research Council (ERC) (H2020-ERC-STG-2015-678777); Agence Nationale de la Recherche (ANR) (LabEx FOCUS ANR-11-LABX-0013).
Funders:
Funding AgencyGrant Number
European Research Council (ERC)678777
Agence Nationale pour la Recherche (ANR)ANR-11-LABX-0013
Issue or Number:9
Record Number:CaltechAUTHORS:20190404-091845598
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20190404-091845598
Official Citation:Simona Lombardo, Thibault Behaghel, Bertrand Chambion, Stéphane Caplet, Wilfried Jahn, Emmanuel Hugot, Eduard Muslimov, Melanie Roulet, Marc Ferrari, Christophe Gaschet, and David Henry, "Curved detectors for astronomical applications: characterization results on different samples," Appl. Opt. 58, 2174-2182 (2019); doi: 10.1364/ao.58.002174
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:94449
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:04 Apr 2019 17:16
Last Modified:09 Mar 2020 13:18

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