Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature

Smith, Joshua R. and Adhikari, Rana X. and Aleman, Katerin M. and Avila-Alvarez, Adrian and Billingsley, Garilynn and Gleckl, Amy and Guerrero, Jazlyn and Markosyan, Ashot and Penn, Steven D. and Rocha, Juan A. and Rose, Dakota and Wright, Robert (2019) Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature. . (Submitted) https://resolver.caltech.edu/CaltechAUTHORS:20190409-124545596

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Abstract

Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.

Item Type:

Report or Paper (Discussion Paper)

Related URLs:

URL	URL Type	Description
http://arxiv.org/abs/1901.11400	arXiv	Discussion Paper

ORCID:

Author	ORCID
Adhikari, Rana X.	0000-0002-5731-5076
Billingsley, Garilynn	0000-0002-4141-2744

Group:

LIGO

Other Numbering System:

Other Numbering System Name	Other Numbering System ID
LIGO Document	P1700151

Classification Code:

OCIS codes: (290.1483) BSDF, BRDF, and BTDF; (240.0310) Thin films

DOI:

10.48550/arXiv.1901.11400

Record Number:

CaltechAUTHORS:20190409-124545596

Persistent URL:

https://resolver.caltech.edu/CaltechAUTHORS:20190409-124545596

Usage Policy:

No commercial reproduction, distribution, display or performance rights in this work are provided.

ID Code:

94591

Collection:

CaltechAUTHORS

Deposited By:

Joy Painter

Deposited On:

09 Apr 2019 19:53

Last Modified:

02 Jun 2023 00:49

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