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Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature

Smith, Joshua R. and Adhikari, Rana X. and Aleman, Katerin M. and Avila-Alvarez, Adrian and Billingsley, Garilynn and Gleckl, Amy and Guerrero, Jazlyn and Markosyan, Ashot and Penn, Steven D. and Rocha, Juan A. and Rose, Dakota and Wright, Robert (2019) Apparatus to Measure Optical Scatter of Coatings Versus Annealing Temperature. . (Submitted) http://resolver.caltech.edu/CaltechAUTHORS:20190409-124545596

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Abstract

Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this scatter.


Item Type:Report or Paper (Discussion Paper)
Related URLs:
URLURL TypeDescription
http://arxiv.org/abs/1901.11400arXivDiscussion Paper
ORCID:
AuthorORCID
Adhikari, Rana X.0000-0002-5731-5076
Billingsley, Garilynn0000-0002-4141-2744
Group:LIGO
Other Numbering System:
Other Numbering System NameOther Numbering System ID
LIGO DocumentP1700151
Classification Code:OCIS codes: (290.1483) BSDF, BRDF, and BTDF; (240.0310) Thin films
Record Number:CaltechAUTHORS:20190409-124545596
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:20190409-124545596
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:94591
Collection:CaltechAUTHORS
Deposited By: Joy Painter
Deposited On:09 Apr 2019 19:53
Last Modified:09 Apr 2019 19:53

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