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Power dependence of phase noise in microwave kinetic inductance detectors

Gao, Jiansong and Mazin, Benjamin and Daal, Miguel and Day, Peter and LeDuc, Henry and Zmuidzinas, Jonas (2006) Power dependence of phase noise in microwave kinetic inductance detectors. In: Millimeter and Submillimeter Detectors and Instrumentation for Astronomy III. Proceedings of SPIE. No.6275. Society of Photo-Optical Instrumentation Engineers (SPIE) , Bellingham, WA, Art. No. 627509. ISBN 9780819463401. https://resolver.caltech.edu/CaltechAUTHORS:20190517-144513820

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Abstract

Excess phase noise has been observed in microwave kinetic inductance detectors (MKIDs) which prevents the noise-equivalent power (NEP) of current detectors from reaching theoretical limits. One characteristic of this excess noise is its dependence on the power of the readout signal: the phase noise decreases as the readout power increases. We investigated this power dependence in a variety of devices, varying the substrate (silicon and sapphire), superconductor (aluminum and niobium) and resonator parameters (resonant frequency, quality factor and resonator geometry). We find that the phase noise has a power law dependence on the readout power, and that the exponent is -1/2 in all our devices. We suggest that this phase noise is caused by coupling between the high-Q microwave resonator that forms the sensitive element of the MKID and two-level systems associated with disorder in the dielectric material of the resonator. The physical situation is analogous to the resonance fluorescence in quantum optics, and we are investigating the application of resonance fluorescence theory to MKID phase noise.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1117/12.672590DOIArticle
ORCID:
AuthorORCID
Daal, Miguel0000-0002-1134-2116
Additional Information:© 2006 Society of Photo-Optical Instrumentation Engineers (SPIE).
Subject Keywords:kinetic inductance detector, phase noise, two level system, resonance fluorescence
Series Name:Proceedings of SPIE
Issue or Number:6275
Record Number:CaltechAUTHORS:20190517-144513820
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20190517-144513820
Official Citation:Jiansong Gao, Benjamin Mazin, Miguel Daal, Peter Day, Henry LeDuc, and Jonas Zmuidzinas "Power dependence of phase noise in microwave kinetic inductance detectors", Proc. SPIE 6275, Millimeter and Submillimeter Detectors and Instrumentation for Astronomy III, 627509 (27 June 2006); doi: 10.1117/12.672590; https://doi.org/10.1117/12.672590
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:95573
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:20 May 2019 17:30
Last Modified:03 Oct 2019 21:14

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