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Comment on “Effects of focused ion beam milling on the nanomechanical behavior of a molybdenum-alloy single crystal” Appl. Phys. Lett. 91, 111915 (2007)

Greer, Julia R. and Espinosa, Horacio and Ramesh, K. T. and Nadgorny, Edward (2008) Comment on “Effects of focused ion beam milling on the nanomechanical behavior of a molybdenum-alloy single crystal” Appl. Phys. Lett. 91, 111915 (2007). Applied Physics Letters, 92 (9). Art. No. 096101. ISSN 0003-6951. https://resolver.caltech.edu/CaltechAUTHORS:GREapl08

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Abstract

While this article provides insight into differences in mechanics between Ga+-irradiated and “pure” surfaces of molybdenum, there are several statements that are either inaccurate or poorly stated. It is clear that when a surface is directly irradiated by orthogonal ion beam (0.07–0.21 mW), a focused ion beam (FIB) damage layer will likely form and affect the strength. However, this finding does not provide adequate foundation for raising the question of FIB-induced hardening in nanopillars, given the vast differences between these experiments and procedure used in pillar fabrication. These issues would cause considerable confusion and result in disservice to mechanical testing community if not clarified.


Item Type:Article
ORCID:
AuthorORCID
Greer, Julia R.0000-0002-9675-1508
Additional Information:Copyright © 2008 American Institute of Physics. Received 21 November 2007; accepted 27 January 2008; published 3 March 2008.
Subject Keywords:focused ion beam technology, ion beam effects, micromechanics, milling, molybdenum alloys, nanostructured materials
Issue or Number:9
Record Number:CaltechAUTHORS:GREapl08
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:GREapl08
Alternative URL:http://dx.doi.org/10.1063/1.2889997
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:9716
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:10 Mar 2008
Last Modified:03 Oct 2019 00:03

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