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Investigation of Twin-Wall Structure at the Nanometer Scale Using Atomic Force Microscopy

Shilo, Doron and Ravichandran, Guruswami and Bhattacharya, Kaushik (2007) Investigation of Twin-Wall Structure at the Nanometer Scale Using Atomic Force Microscopy. In: Experimental Analysis of Nano and Engineering Materials and Structures. Springer , Dordrecht, pp. 385-386. ISBN 978-1-4020-6238-4. https://resolver.caltech.edu/CaltechAUTHORS:20190828-083227549

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Abstract

The structure of twin-walls and their interaction with defects has important implications for the behavior of a variety of materials including ferroelectric, ferroelastic, and co-elastic crystals. One unique characteristic of such crystals is that their physical properties as well as their macroscopic response to electrical, mechanical, and optical loads are strongly related to their microstructural twin patterns. These, in turn, are governed by the atomistic and mesoscale structure of twin-walls and their interaction with other crystal defects.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1007/978-1-4020-6239-1_191DOIArticle
https://rdcu.be/b3YkSPublisherFree ReadCube access
ORCID:
AuthorORCID
Ravichandran, Guruswami0000-0002-2912-0001
Bhattacharya, Kaushik0000-0003-2908-5469
Additional Information:© 2007 Springer.
Record Number:CaltechAUTHORS:20190828-083227549
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20190828-083227549
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:98283
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:28 Aug 2019 16:23
Last Modified:05 May 2020 20:39

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