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Corrosion Behavior of Parylene-Metal-Parylene Thin Films in Saline

Li, W. and Rodger, D. C. and Menon, P. R. and Tai, Y. C. (2008) Corrosion Behavior of Parylene-Metal-Parylene Thin Films in Saline. ECS Transactions, 11 (18). pp. 1-6. ISSN 1938-5862. doi:10.1149/1.2897437.

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In this paper, we study the corrosion behavior of parylene-metal-parylene thin films using accelerated-lifetime soak tests. The samples under test are thin film resistors with a 200 nm layer of Au sandwiched by parylene-C on both sides, fabricated with parylene-metal skin technology. The samples are tested in hot saline both passively and actively, and different failure modes are observed using optical and electron-beam metrologies. Bubbles and delamination are first seen in the samples after 2 days of soaking under passive conditions, and followed by metal corrosion. While under active conditions, either bubbles or parylene breakdowns are observed depending on the thickness of parylene packaging. These results contribute to a better understanding of the failure mechanisms of parylene packaging in body fluids.

Item Type:Article
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URLURL TypeDescription
Li, W.0000-0003-2543-2558
Rodger, D. C.0000-0002-1583-5946
Tai, Y. C.0000-0001-8529-106X
Additional Information:© 2008 ECS - The Electrochemical Society. This work was supported in part by the Engineering Research Center Program of the National Science Foundation under Award Number EEC-0310723 and by a fellowship from the Whitaker Foundation (D.R.). The authors would also like to thank Mr. Trevor Roper and other members in the Caltech Micromachining Laboratory for their assistance with fabrication. ECS Transactions, Volume 11, Issue 18, 212th ECS Meeting, October 7 - October 12, 2007, Washington, DC. Corrosion (General). Editor(s): A. Davenport.
Issue or Number:18
Record Number:CaltechAUTHORS:LIWecst08
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:9841
Deposited By: Archive Administrator
Deposited On:21 Mar 2008
Last Modified:08 Nov 2021 21:02

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