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Random Surface Texturing of mc-Silicon for Solar Cells with Picosecond Lasers; a Comparison between 1064 nm, 532 nm and 355 nm Laser Emission Wavelengths

Binetti, Simona and Le Donne, Alessia and Rolfi, Andrea and Grilli, Emanuele and Jäggi, Beat and Neuenschwander, Beat and Busto, Chiara and Scorticati, Davide and Longoni, Luca and Pellegrino, Sergio (2015) Random Surface Texturing of mc-Silicon for Solar Cells with Picosecond Lasers; a Comparison between 1064 nm, 532 nm and 355 nm Laser Emission Wavelengths. In: 2015 Conference on Lasers and Electro-Optics (CLEO). Optical Society of America , Washington, DC, Art. No. AM2K.5. ISBN 978-1-55752-968-8. https://resolver.caltech.edu/CaltechAUTHORS:20191002-150220868

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Abstract

Multicrystalline Silicon was textured with picosecond laser. Different laser wavelengths (λ = 1064, 532, 355 nm) where compared regarding laser-induced damage. We found that λ = 355 nm picosecond radiation resulted in shallower defect-reach region.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1364/cleo_at.2015.am2k.5DOIArticle
https://ieeexplore.ieee.org/document/7182897PublisherArticle
ORCID:
AuthorORCID
Pellegrino, Sergio0000-0001-9373-3278
Additional Information:© 2015 Optical Society of America.
Classification Code:OCIS codes: 140.7090, 140.3390
Record Number:CaltechAUTHORS:20191002-150220868
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20191002-150220868
Official Citation:S. Binetti, A. Le Donne, A. Rolfi, E. Grilli, B. Jäggi, B. Neuenschwander, C. Busto, D. Scorticati, L. Longoni, and S. Pellegrino, "Random Surface Texturing of mc-Silicon for Solar Cells with Picosecond Lasers; a Comparison between 1064 nm, 532 nm and 355 nm Laser Emission Wavelengths," in CLEO: 2015, OSA Technical Digest (online) (Optical Society of America, 2015), paper AM2K.5
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:99030
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:02 Oct 2019 22:08
Last Modified:03 Oct 2019 21:46

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