Published May 1988 | Version Published
Journal Article Open

Tunable superlattice p-i-n photodetectors: characteristics, theory, and application

Abstract

Extended measurements and theory on the recently developed monolithic wavelength demultiplexer consisting of voltage-tunable superlattice p-i-n photodetectors in a waveguide confirmation are discussed. It is shown that the device is able to demultiplex and detect two optical signals with a wavelength separation of 20 nm directly into different electrical channels at a data rate of 1 Gb/s and with a crosstalk attenuation varying between 20 and 28 dB, depending on the polarization. The minimum acceptable crosstalk attenuation at a data rate of 100 Mb/s is determined to be 10 dB. The feasibility of using the device as a polarization angle sensor for linearly polarized light is also demonstrated. A theory for the emission of photogenerated carriers out of the quantum wells is included, since this is potentially a speed limiting mechanism in these detectors. It is shown that a theory of thermally assisted tunneling by polar optical phonon interaction is able to predict emission times consistent with the observed temporal response.

Additional Information

© 1988 IEEE. Manuscript received August 18, 1987. This work was supported by the National Swedish Board for Technical Development and by the Office of Naval Research, the ITT Corporation, and NASA/JPL. The authors would like to thank M. Jonsson for helpful discussions.

Attached Files

Published - LARieeejqe88.pdf

Files

LARieeejqe88.pdf

Files (1.1 MB)

Name Size Download all
md5:7a5aaf87a8e49dea235bf8ef85c343ad
1.1 MB Preview Download

Additional details

Identifiers

Eprint ID
31799
Resolver ID
CaltechAUTHORS:20120604-133653246

Funding

National Swedish Board for Technical Development
Office of Naval Research (ONR)
ITT Corporation
NASA/JPL

Dates

Created
2012-06-05
Created from EPrint's datestamp field
Updated
2021-11-09
Created from EPrint's last_modified field

Caltech Custom Metadata

Other Numbering System Name
INSPEC Accession Number
Other Numbering System Identifier
3233023