Published June 4, 2001
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Journal Article
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Electronic properties of mechanically induced kinks in single-walled carbon nanotubes
Abstract
We have used an atomic-force microscope tip to mechanically buckle single-walled carbon nanotubes. The resistance of the induced defects ranged from 10 to 100 k Omega and varied with the local Fermi level, as determined by scanned-gate microscopy. By forming two closely spaced defects on metallic nanotubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to ~165 K.
Additional Information
Copyright © 2001 American Institute of Physics. Received 27 December 2000; accepted 9 April 2001. This work was supported in part by NSF Grant Nos. DMR-00-72618, DMR-98-0936, PHY-98-71810, and ONR Grant No. N00014-96-0108, the Dreyfus Foundation, and the Research Corporation (H.P.).Files
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- 5352
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- CaltechAUTHORS:BOZapl01
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2006-10-13Created from EPrint's datestamp field
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2021-11-08Created from EPrint's last_modified field