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Published October 15, 2000 | Version Published
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Interferometric phase-dispersion microscopy

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Abstract

We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples.

Additional Information

© 2000 Optical Society of America Received July 20, 2000 This work was carried out at the Laser Biomedical Research Center of the Massachusetts Institute of Technology and was by supported by National Institutes of Health (NIH) grant P41-RR02594, National Science Foundation grant 9708265-CHE, and a grant from Hamamatsu Corporation. Adam Wax and Irene Georgakoudi were supported by NIH National Research Service Awards 1 F32 RR05075-01 and 1 F32 CA80345-01, respectively.

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Identifiers

Eprint ID
3328
Resolver ID
CaltechAUTHORS:YANol00

Related works

Describes
http://www.opticsinfobase.org/abstract.cfm?URI=ol-25-20-1526 (URL)

Funding

NIH
P41-RR02594-18
NSF
CHE-9708265
Hamamatsu Corporation
NIH Postdoctoral Fellowship
1 F32 RR05075-01
NIH Postdoctoral Fellowship
1 F32 CA80345-01

Dates

Created
2006-05-30
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Updated
2020-03-09
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