Digital signal processor control of scanned probe microscopes
Digital signal processors have made it possible to control scanned probe microscopes using straightforward software emulations of analog circuits. Using a system consisting of a commercially available digital signal processor board interfaced to analog I/O, we have developed algorithms for self-optimizing feedback, raster generation (with hysteresis correction, sample tilt compensation, and scan rotation), lock-in detection, and automatic tip-sample approach. We also discuss an instruction parser that takes advantage of the digital architecture to allow automatic operation for extended periods.
Additional Information© 1993 American Institute of Physics. Received 20 March 1992; accepted 17 March 1993. Financial support was provided by Ford Motor Company, Abbott Laboratories, Topometrix, Inc., a National Science Foundation predoctoral fellowship (D.R.B.), a National Institutes of Health traineeship (S.M.C.), and a Department of Education fellowship (M.G.Y.). We would like to thank Sie-Ting Wong of Abbott Laboratories for providing the bovine serum albumen sample and Shubert Soares for providing the polished quartz.
Published - BASrsi93b.pdf