Evidence of Simultaneous Double-Electron Promotion in
F
Collisions with Surfaces
J. Mace, M. J. Gordon, and K. P. Giapis
*
Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena, California 91125, USA
(Received 15 August 2006; published 22 December 2006)
A high-flux beam of mass-filtered
F
at low energy (100 –1300 eV) was scattered off Al and Si surfaces
to study core-level excitations of
F
0
and
F
. Elastic scattering behavior for
F
was observed at energies
<
300
(500) eV off Al (Si) for a 90
lab angle. However, above this energy threshold, orbital mixing in the
hard collision step results in electronic excitation of F via molecular orbital promotion along the
4
f
(
F
-
2
p
), significantly reducing the observed ion exit energy. In addition, despite the electronegativity of F,
scattering at energies
>
450
(700) eV off Al (Si) produces
F
2
— behavior which is remarkably similar to
Ne
off the same surfaces. Inelasticities measured for single collision events agree well with the energy
deficits required to form (doubly excited)
F
and
F
states from
F
0
and
F
, respectively; these excited
species most likely decay to inelastic
F
and
F
2
via autoionization.
DOI:
10.1103/PhysRevLett.97.257603
PACS numbers: 79.20.Rf, 34.50.Dy, 34.50.Fa, 34.70.+e
Scattering of electronegative gas atoms and ions (i.e., O,
F, Cl) off surfaces is generally accompanied by highly
efficient electron capture processes; as such, the scattered
particle flux is largely composed of anions and neutrals [
1
–
6
]. Negative ion formation via resonant capture is quite
probable because image charge effects near a metal surface
tend to shift the projectile anion level below the Fermi level
of the surface [
6
]. As such, charge exchange in these
systems is largely governed by nonlocal processes as the
projectile approaches or rebounds from the surface.
However, local interactions involving double-electron pro-
motion have been shown to be important in some systems,
resulting in significant positive ion production. For in-
stance,
Ne
scattering off light targets (Mg, Al, Si, and
P) at low energy results in very high positive ion yields
(
Ne
and even
Ne
2
)[
7
,
8
]. Since the electron energy level
ordering of F and Ne is identical with respect to these
targets, electron promotions in F should also occur. In
fact, such effects should be seen at collision energies
even lower than those for
Ne
.
In this Letter, we show that double promotion along the
4
f
molecular orbital (MO) does occur for both
F
0
and
F
when
F
is scattered off Al and Si surfaces. Inelastic
F
and
F
2
exit channels were observed at low collision
energies (
>
450
–
700 eV
=
90
lab angle); energy losses
for single-scatter events show that
F
0
!
F
and
F
!
F
, followed by autoionization, are responsible for the
1
and
2
exits, respectively. Furthermore, the threshold
R
min
calculated for
4
f
MO promotion in the F-Si quasi-
molecule agree quite well with the experimental onset of
F
2
production (
R
min
0
:
5
–
0
:
6
A
).
Experiments were performed in a custombuilt ion beam-
line scattering apparatus described in detail elsewhere [
9
].
Ions were produced in a 13.56 MHz rf-driven inductively
coupled plasma discharge with a feed of
1:1 CF
4
:O
2
(5 sccm), operating at 2 mTorr and 600 W. Ion energy
was adjusted by floating the plasma above ground with dc.
After ion extraction, magnetic mass-filtering, and fast neu-
tral removal, a
2
–
3
A
beam of
F
(3 mm diameter) was
delivered at 45
onto a grounded target (
n
-type Si wafer or
polycrystalline Al, freshly sputtered and annealed).
Scattered products were monitored at a 90
lab angle
with a triply differentially pumped 90
hemispherical-
sector energy analyzer in series with a quadrupole mass
spectrometer.
Figure
1
shows the mean exit energies of
F
and
F
2
resulting from single-scatter (SS) collisions of
F
projec-
tiles (
E
0
100
–
1300 eV
) with Si, along with the elastic
prediction for
lab
90
(kinematic factor
K
0
:
191
[
10
]). Two distinct regions with respect to incident energy
are readily apparent where the collision kinematics are
quite different. For
E
0
<
500 eV
, scattering is essentially
elastic with minor losses attributable (at first glance) to
FIG. 1. Exit energies of
F
and
F
2
resulting from single
binary collisions of
F
projectiles with Si at a 90
lab angle
along with elastic prediction (solid line). Error bars are partially
shown to avoid clutter. (Inset) Exit energy distributions for
F
=
F
2
when
E
0
1290 eV
.
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electron straggling (electron drag) [
11
] on the incoming
and outgoing trajectory paths as the projectile encounters
the target bands. However, careful inspection of the energy
offset in region 1 reveals that straggling losses (a few eV in
our case [
8
]) cannot be solely responsible for the deviation.
Identical experiments with
Ne
projectiles on bare and
fluorinated Si (
F
=
Si
) show that the surface
Si
x
F
y
layer
(which commonly forms in F etching environments [
12
])
significantly increases straggling: i.e.,
Ne
off bare Si is
perfectly elastic (within 3–5 eV [
9
]), while
Ne
and
F
off
F
=
Si
show much larger deviations. This observation can be
rationalized on the grounds that chemisorbed fluorine will
draw a considerable amount of electron density toward the
surface which could likely increase the total electron drag
on the projectile. In any case, we see that region 1 is
effectively elastic in nature overall because the collision
apsis (distance of closest approach
R
min
) is relatively large
at low
E
0
(i.e.,
R
min
0
:
65
A@400 eV
=
90
, Thomas-
Fermi-Molie
`
re potential with Firsov screening length
[
10
]); as such, significant overlap of the core-shell atomic
orbitals (AO’s) of the collision partners (
F
Si
) has not yet
occurred.
However, when the collision energy is raised above a
critical value (
E
0
700 eV
), the overall kinematics of the
system change entirely —
F
becomes quite inelastic and
F
2
suddenly appears with an even greater energy offset.
The measured average exit energy of
F
is 35– 40 eV
lower than that predicted by the binary collision approxi-
mation (BCA) for a 90
elastic deflection [
9
]. The simul-
taneous appearance of these two phenomena above a
critical collision energy is a clear indicator of electronic
transitions taking place in the hard collision step as the
AO’s of the colliding partners intermix at small
R
min
.For
instance, AO overlap at a close distance (
<
0
:
5
A
) gives
rise to hybrid MO’s during the close encounter portion of
the scattering trajectory when a short-lived (
10
15
s
)
quasimolecule is formed. In certain cases, particular
MO’s of the quasimolecule may be highly promoted in
energy (due to degeneracy) so as to cross other MO’s
which will ultimately decay into Rydberg states as the
atoms separate (Barat-Fano-Lichten theory [
13
]). At these
crossings, electron exchange can occur, leaving one of the
exiting species in an excited state after the collision with a
kinetic energy deficit. Indeed, very similar behavior has
been seen for
Ne
off Mg, Al, Si, and P targets [
8
]. In this
situation, inelastic
Ne
=
Ne
2
below a critical apsis is
caused by double promotion of electrons from the Ne
2
p
z
(
4
f
MO) to the Ne
3
s
in the hard collision step
(i.e.,
2
p
6
!
2
p
4
3
s
2
and
2
p
5
!
2
p
3
3
s
2
). These excited
states (
Ne
and
Ne
) then decay far from the surface
via autoionization to give
Ne
and
Ne
2
with large kinetic
energy deficits that directly correlate with the energy re-
quirements for excitation [
Ne
0
!
Ne
(41– 45 eV) and
Ne
!
Ne
(69 –72 eV)]. The fact that both the
F
and
F
2
energy losses remain relatively constant with
E
0
,so
long as the threshold
R
min
0
:
52
A
(700 eV at 90
) has
been reached, further suggests that well-defined electronic
excitations are at play in the
F
Si
system.
Additional evidence for a fundamental excitation
mechanism comes from energy loss measurements using
an Al target. Since the energy ordering of AO’s of Al and Si
is identical with respect to the F projectile (i.e., the MO
correlation diagram is the same [
13
]), collision kinematics
for SS events off Al and Si should be quite similar. Indeed,
this is the case (Fig.
2
), except that the
F
inelasticity and
F
2
production begin at a lower collision energy (larger
R
min
0
:
59
–
0
:
62
A
). This latter effect is simply due to the
L
shell of Si being closer to the nucleus than that for Al.
Small differences also occur at low
E
0
;
F
scattering off Al
is almost perfectly elastic. It is likely that the fluorinated
layer (
Al
x
F
y
) on the Al surface is significantly thinner than
that for Si because F spontaneously reacts with Si [
12
] but
not with Al. Smaller straggling losses would be expected
due to lower electron density in the surface region because
of less F on the surface. We also see that the scattered
F
intensity [
14
] makes a large jump when inelastic losses
become significant (Si is analogous). In general, the scat-
tered ion yield increases exponentially with inverse pro-
jectile velocity because of contact time arguments [
10
];
i.e., a slower projectile has a larger probability of being
neutralized by Auger or resonant charge transfer with the
surface as a whole. However, the rapid increase in
F
at the
threshold indicates the sudden turn-on of ‘‘additional’’
F
generation. Finally, it should be noted that the total
F
2
production continually increases with collision energy and
that it is smaller (
10
–
50
x
less) than
F
.
Previous experimental studies of F collision kinematics
at low energy are sparse [
1
,
15
] and
F
2
off Si has been
reported only once [
16
]. Hird
et al.
detected
F
2
off Si
using
F
projectiles when
R
min
<
0
:
25
A
(
E
0
>
3
:
8 keV
at
lab
63
); as a comparison, the same study found that
Ne
2
was formed when
R
min
<
0
:
573
A
(
E
0
>
800 eV
at
lab
48
). This large apsis discrepancy between F and
FIG. 2.
Exit energies and intensities of
F
and
F
2
resulting
from single binary collisions of
F
with Al at a 90
lab angle.
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Ne is contrary to intuition given that the energy ordering of
AO’s for F and Ne with respect to Si is identical. In our
experiments, the onset of inelastic
F
and
F
2
generation
occurs at much larger apsides — on par with those expected
in light of
Ne
=
Ne
2
. To look more carefully at possible
mechanisms for
F
=
F
2
, raw energy losses measured in
the lab reference frame must be converted to the center-of-
mass system and adjusted for straggling. When
lab
90
,
the binary collision inelasticity (
Q
bin
), i.e., the total energy
that is directly available for electronic excitation in the
hard collision, can be evaluated quite simply [
10
]:
E
exit
K
E
0
Q
1
1
Q
bin
Q
3
;
(1)
where
E
0
is the projectile energy,
K
1
=
1
is
the kinematic factor,
M
t
=M
p
is the target-to-projectile
mass ratio, and
Q
1
;
3
represents the straggling losses [
17
]on
the incoming (1) and outgoing (3) parts of the collision
trajectory. Inelasticity values determined in this fashion are
given in Fig.
3
along with the energy requirements for
several
F
0
=
F
=
F
excitation channels [
18
] using the
Ne
0
=
Ne
system for inspiration. Transition energies have
been referenced to the slowly increasing baseline because
of the aforementioned augmented straggling affects due to
surface fluorination. On this graph, one immediately sees
that the
Q
bin
values for
F
and
F
2
are large, relatively
constant, and fall within well-defined ranges when
R
min
<
0
:
55
A
. Incidentally, this apsis value is exactly that pre-
dicted for
L
-
L
shell overlap of
F
Si
(crosshatched re-
gion) [
19
], suggesting that AO mixing is ultimately
responsible for the opening of new excitation channels.
As indicated, the energy loss data can be conveniently
assigned to transitions initiating from ground state
F
0
or
F
(subject to the sloping baseline):
F
!
neut
F
0
!
MO
F
2
p
3
3
s
2
!
AI
F
;Q
bin
35 eV
;
F
!
MO
F
2
p
2
3
s
2
!
AI
F
2
;Q
bin
62 eV
:
In the first case,
F
is neutralized to
F
0
on approach to the
surface through nonlocal processes (Auger and/or resonant
charge transfer [
10
]), followed by double excitation to
F
via molecular orbital promotion (analogous to
Ne
0
!
Ne
) in the hard collision step. Since the lifetime of
F
is likely to be longer than the collision time (i.e., the
Ne
lifetime is
>
10
14
s
[
20
], so
F
should be similar),
F
can
leave the surface intact and subsequently autoionize (AI) to
F
far from the surface. This mechanism is probable
because most projectile ions approaching the surface will
be efficiently neutralized before the hard collision occurs
[
10
]. For
F
2
, an analogous process occurs where the
precursor state entering the hard collision is instead
F
,
which has survived neutralization on the incoming trajec-
tory path. This hypothesis is strongly supported by the
much smaller
F
2
signal intensity compared to
F
(inset
in Fig.
1
). Although double collisions are frequently sug-
gested as the cause of a
2
channel [
21
] (i.e.,
F
0
goes to
F
in the first collision, followed by
F
to
F
2
by direct ion-
ization in the second), we see that the magnitude of the
2
energy loss is too great for such an explanation [62 – 98 eV
vs.
17
:
4
collision no.
1
35
no.
2
52
:
4eV
]. In fact,
these two mechanisms are identical to those proposed for
Ne
inelasticity and
Ne
2
formation off Si; indeed, one
FIG. 3.
Binary inelasticities (
Q
bin
)of
F
and
F
2
off Si
determined with Eq. (
1
). Transition energies for several projec-
tile excitations are shown. Grey areas represent the range of
Q
bin
values possible due to the presence of several different doubly
excited final states. The crosshatched region denotes the colli-
sion apsides where the maximum electron density overlap of the
F(
2
s=
2
p
) and Si (
2
s=
2
p
) orbitals would occur.
FIG. 4.
Orbital energies for the F-Si molecule as a function of
internuclear distance. The calculated
orbitals (
orbitals) are
indicated by solid (dashed) lines; the atomic character of each
MO is shown to the right. Strong promotion (heavy dashed line)
along the
4
f
MO occurs near
R
min
0
:
6
A
, allowing projectile
excitation to the
F
(
2
p
3
3
s
2
) and
F
(
2
p
2
3
s
2
) states.
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would surmise that such processes should be rather generic
when orbital energy orderings and promotion are similar.
To further support this claim, molecular orbital calcula-
tions [
22
] were carried out to determine the range of
R
min
needed for
4
f
MO promotion (Fig.
4
). These results
demonstrate that excitation of the F
2
p
along the
4
f
MO should occur for
R
min
0
:
5
–
0
:
6
A
— identical to the
experiment.
Given the above mechanism, it is now possible to ex-
plain the
F
=
F
2
intensity variations with collision energy
(Fig.
2
). The sudden increase in scattered
F
can be
associated with opening of the
F
0
!
F
!
F
channel.
For
F
2
, the continual increase with
E
0
results from less
efficient neutralization of the projectile
F
as the energy is
raised. The large difference overall between the
F
and
F
2
intensities is due to the
F
projectile being neutralized
to
F
0
most of the time — and
F
0
cannot produce
F
2
in a
single collision event. Finally, the tapering off of the
F
signal at high energies is similar to the case of
Ne
off Si,
which has been explained as due to collision-induced
neutralization in the hard collision step [
8
], i.e., resonant
transfer from the target bands to the
4
f
MO (filling the F
2
p
z
)— which can occur only if the
4
f
is highly promoted
at small
R
min
. Although the present study has emphasized
only ions and their associated energy losses, identical
processes surely occur for neutral projectiles with respect
to an inelastic
F
exit, i.e., formation of
F
(which auto-
ionizes to
F
) that descends from an
F
0
precursor. There-
fore, energetic neutrals formed by ion neutralization will
show similar interaction dynamics and inelastic losses.
In conclusion, scattering of F ions off Si and Al surfaces
at low energies follows the BCA closely until a threshold is
reached where electron promotions result in significant
inelasticity for the exiting projectile. Core-level electronic
excitations of
F
0
and
F
via double promotion were seen to
be responsible for the inelastic
F
and
F
2
exit channels,
respectively, when
R
min
<
0
:
52
A
(
700 eV
=
90
) and
0.60 A
̊
(
450 eV
=
90
) for the F-Si and F-Al collision pairs,
respectively. Despite its electronegativity,
F
scattering off
Al and Si is qualitatively identical to
Ne
from the per-
spective of a well-defined
2
turn-on, continually increas-
ing
2
yield with impact energy, and inelasticity values
which point to the same
4
f
double promotion mecha-
nism. Thus, in the range of energies where electron promo-
tion is observed, it appears that chemical interactions are
irrelevant. Finally, for incident energies larger than thresh-
old, scattered F atoms and ions will possess kinetic ener-
gies lower than those predicted by BCA. Since scattered
ions are important in patterning of semiconductor devices
using plasma etching, energy losses suffered in sidewall
collisions will influence the etch rate and pattern profile
[
23
].
This work was based on research funded by the National
Science Foundation (No. CTS-0317397).
*
Corresponding author.
Electronic address: giapis@cheme.caltech.edu
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week ending
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