Published June 2010 | Version Published
Journal Article Open

Generalized Time- and Transfer-Constant Circuit Analysis

Abstract

The generalized method of time and transfer constants is introduced. It can be used to determine the transfer function to the desired level of accuracy in terms of time and transfer constants of first-order systems using exclusively low frequency calculations. This method can be used to determine the poles and zeros of circuits with both inductors and capacitors. An inductive proof of this generalized method is given which subsumes special cases, such as methods of zero- and infinite-value time constants. Several important and useful corollaries of this method are discussed and several examples are analyzed.

Additional Information

© 2010 IEEE. Manuscript received February 17, 2009; revised May 20, 2009; accepted July 08, 2009. First published November 24, 2009; current version published June 09, 2010. This paper was recommended by Associate Editor W. A. Serdijn. The author would like to thank T. Arai, J. Arroyo, A. Babakhani, F. Bohn, S. Bowers, J. Chen, E. Keehr, A. Komijani, S. Kosai, S. Mehta, A. Natarajan, K. Sengupta, C. Sidiris, H. Wang, Y. J. Wang, and J. Yoo formerly or currently of Caltech for valuable feedback on the manuscript. The author would also like to thank the anonymous reviewers as well as Prof. B. Murmann of Stanford University and Prof. H. Hashemi of USC for their constructive feedback on the manuscript. Last, but not least, the author is particularly indebted to the students in Caltech's EE114 series who helped improve this material substantially over more than a decade by asking great questions and refusing to accept incomplete answers.

Attached Files

Published - Hajimiri2010p11511Ieee_T_Circuits-I.pdf

Files

Hajimiri2010p11511Ieee_T_Circuits-I.pdf

Files (568.0 kB)

Name Size Download all
md5:cf1ed2551e73a52dab64e8ebc9bd3a5e
568.0 kB Preview Download

Additional details

Identifiers

Eprint ID
20383
Resolver ID
CaltechAUTHORS:20101011-132051958

Dates

Created
2010-11-23
Created from EPrint's datestamp field
Updated
2021-11-08
Created from EPrint's last_modified field

Caltech Custom Metadata

Other Numbering System Name
INSPEC Accession Number
Other Numbering System Identifier
11341217