of 9
Copyright WILEY-VCH Verlag GmbH & Co. KGaA, 69469 Weinheim, Germany, 2016.
Supporting Information
for
Adv. Energy Mater.,
DOI: 10.1002/aenm.201601992
Porous Nanomaterials for Ultrabroadband Omnidirectional
Anti-Reflection Surfaces with Applications in High
Concentration Photovoltaics
Yuan Yao
, Kyu-Tae Lee
, Xing Sheng
, Nicolas A. Batara
, Nina
Hong
, Junwen He
, Lu Xu
, Muhammad M. Hussain
, Harry
A. Atwater
, Nathan S. Lewis
, Ralph G. Nuzzo
,* and
John A.
Rogers
*
1
Supporting Information
Porous Nanomaterials for Ultrabroadband Omnidirectional Anti
-
reflection Surfaces
with Applications in H
igh Concentration Photovoltaics
Yuan Yao,† Kyu
-
Tae
Lee,† Xing Sheng, Nicolas A. Batara, Nina Hong, Junwen He, Lu Xu,
Muhammad M. Hussain, Harry A. Atwater, Nathan S. Lewis, Ralph G. Nuzzo
*
and John A.
Roger
s*
Figure S1.
Thermogravimetric analysis data of PMMSQ/
P
S
-
b
-
P2VP mixture (65%
PS
-
b
-
P2VP loading) measured by Q50
-
TGA at a temperature ramp
rate
of 5 ºC per minute.
0
200
400
600
0
20
40
60
80
100
Temperature (ºC)
Weight Loss (%)
2
Figure S2.
(
A
) Film thickness as a function of polymer mixture solution concentration
(4
8
%
P2VP loading
,
with a spin
-
speed of
2000 rpm
)
;
(
B
) Refractive index
(black triangles)
and
porosity (
blue squares,
calculated with
Equation (1))
as a function of PS
-
b
-
P2VP loading.
0
2
4
6
8
10
0
200
400
600
800
0
20
40
60
80
1.1
1.2
1.3
1.4
0
20
40
60
80
Polymer concentration (%wt)
Film thickness (nm)
(A)
PS
-
b
-
P2VP
loading (%wt)
Refractive index
(B)
Porosity (%)
3
Figure S3.
(
A
) Film thickness
and (
B
) refractive index distribution on a single layer f
ilm
coated on a glass substrate as mapped by a
Focused RC
2
spectroscopic
ellipsometer
.
(A)
(B)