Published April 1, 1982 | Version Published
Book Section - Chapter Open

Electrical and optical measurements on fused quartz under shock compression

Abstract

The resistivities of specimens of SiO_2 (fused quartz) singly and doubly shocked in the 10 to 45 and 27 to 90 GPa range, respectively, demonstrate a marked decrease from values of ∼10Ω⋅m to ∼0.1Ω⋅m at single shock pressure of ∼40 and double shock pressure of ∼74 GPa. The shock‐induced polarizatio profiles also show a sudden change of electrical properties of the material at those pressures. The rapid decrease in resistivity suggests a further transformation to an unknown phase or production of an electron bound level.

Additional Information

© 1982 American Institute of Physics. Published online 01 April 1982.

Attached Files

Published - 1.33328.pdf

Files

1.33328.pdf

Files (303.0 kB)

Name Size Download all
md5:b95c7ce5e709e5c55972935281d6f0f6
303.0 kB Preview Download

Additional details

Identifiers

Eprint ID
51102
Resolver ID
CaltechAUTHORS:20141031-084124664

Dates

Created
2014-10-31
Created from EPrint's datestamp field
Updated
2021-11-10
Created from EPrint's last_modified field

Caltech Custom Metadata

Series Name
AIP Conference Proceedings
Series Volume or Issue Number
78
Other Numbering System Name
Caltech Division of Geological and Planetary Sciences
Other Numbering System Identifier
3652