Published April 13, 2009 | Version Published
Book Section - Chapter Open

Quantum metrology from an information theory perspective

Abstract

Questions about quantum limits on measurement precision were once viewed from the perspective of how to reduce or avoid the effects of quantum noise. With the advent of quantum information science came a paradigm shift to proving rigorous bounds on measurement precision. These bounds have been interpreted as saying, first, that the best achievable sensitivity scales as 1/n, where n is the number of particles one has available for a measurement and, second, that the only way to achieve this Heisenberg-limited sensitivity is to use quantum entanglement. We review these results and show that using quadratic couplings of n particles to a parameter to be estimated, one can achieve sensitivities that scale as 1/n^2 if one uses entanglement, but even in the absence of any entanglement at any time during the measurement protocol, one can achieve a super-Heisenberg scaling of 1/n^(3/2)

Additional Information

© 2009 American Institute of Physics. Issue Date: 13 April 2009. This work was supported in part by the US Office of Naval Research (Grant No. N00014-07-1-0304), the Australian Research Council's Discovery Projects funding scheme (Project No. DP0343094), EPSRC Grant No. EP/C546237/1, and the NSF under grant PHY-0803371. STF was supported by the Perimeter Institute for Theoretical Physics; research at Perimeter is supported by the Government of Canada through Industry Canada and by the Province of Ontario through the Ministry of Research & Innovation.

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Additional details

Identifiers

Eprint ID
18234
Resolver ID
CaltechAUTHORS:20100511-100311769

Funding

U. S. Office of Naval Research
N00014-07-1-0304
Australian Research Council
Project No. DP0343094
EPSRC
EP/C546237/1
NSF
PHY-0803371
Perimeter Institute for Theoretical Physics
Government of Canada through Industry Canada
Province of Ontario through the Ministry of Research & Innovation

Dates

Created
2010-06-24
Created from EPrint's datestamp field
Updated
2021-11-08
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Caltech Custom Metadata

Series Name
AIP Conference Proceedings
Series Volume or Issue Number
1110