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Published June 15, 2004 | public
Journal Article Open

Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator


We have developed a technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump beam and the sensitivity of the probe beam. The result is an enhancement of the response of the instrument by a factor proportional to the square of the finesse of the cavity over conventional interferometric measurements. In this paper we present a description of the technique, and we discuss how the properties of thin films can be deduced from the photothermal response. As an example of the technique, we report a measurement of the thermal properties of a multilayer dielectric mirror similar to those used in interferometric gravitational wave detectors.

Additional Information

©2004 American Institute of Physics. (Received 23 October 2003; accepted 5 March 2004) Many thanks to Alan Weinstein for carefully reading this manuscript and for providing many helpful suggestions. This work was supported by the NSF under Grant No. PHY98-01158.


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