Published November 20, 2000 | Version Published
Journal Article Open

Measurement of the direct energy gap of coherently strained Sn_xGe_(1–x)/Ge(001) heterostructures

  • 1. ROR icon California Institute of Technology

Abstract

The direct energy gap has been measured for coherently strained Sn_xGe_(1–x) alloys on Ge(001) substrates with 0.035 < x < 0.115 and film thickness 50–200 nm. The energy gap determined from infrared transmittance data for coherently strained Sn_xGe_(1–x) alloys indicates a large alloy contribution and a small strain contribution to the decrease in direct energy gap with increasing Sn composition. These results are consistent with a deformation potential model for changes in the valence and conduction band density of states with coherency strain for this alloy system.

Additional Information

© 2000 American Institute of Physics. (Received 29 December 1999; accepted 20 September 2000)

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Alternative title
Measurement of the direct energy gap of coherently strained SnxGe1–x/Ge(001) heterostructures

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Eprint ID
2461
Resolver ID
CaltechAUTHORS:RAGapl00

Dates

Created
2006-04-04
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Updated
2021-11-08
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