Published January 29, 2004
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Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV
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Abstract
We have determined experimentally optical constants for eight thin film materials that can be used in hard X-ray multilayer coatings. Thin film samples of Ni_(.97)V_(.03), Mo, W, Pt, C, B_4C, Si and SiC were deposited by magnetron sputtering onto superpolished optical flats. Optical constants were determined from fits to reflectance-vs-incidence angle measurements made using synchrotron radiation over the energy range E=35-180 keV. We have also measured the X-ray reflectance of a prototype W/SiC multilayer coating over the energy range E=35-100 keV, and we compare the measured reflectance with a calculation using the newly derived optical constants.
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© 2004 Society of Photo-Optical Instrumentation Engineers (SPIE). This research was sponsored in part by a grant from NASA.Attached Files
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- Eprint ID
- 84206
- Resolver ID
- CaltechAUTHORS:20180109-153135729
Funding
- NASA
Dates
- Created
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2018-01-09Created from EPrint's datestamp field
- Updated
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2021-11-15Created from EPrint's last_modified field
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- Caltech groups
- Space Radiation Laboratory
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 5168