Atomic-Scale Imaging in Real and Energy Space Developed in Ultrafast Electron Microscopy
In this contribution, we report the development of ultrafast electron microscopy (UEM) with atomic-scale real-, energy-, and Fourier-space resolutions. This second-generation UEM provides images, diffraction patterns, and electron energy spectra, and here we demonstrate its potential with applications for nanostructured materials and organometallic crystals. We clearly resolve the separation between atoms in the direct images and the Bragg spots/Debye−Scherrer rings in diffraction and obtain the electronic structure and elemental energies in the electron energy loss spectra (EELS) and energy filtered transmission electron microscopy (EFTEM).
Additional Information© 2007 American Chemical Society. Received June 7, 2007. Publication Date (Web): July 10, 2007. This work was supported by the Gordon and Betty Moore Foundation, the National Science Foundation, and the Air Force Office of Scientific Research. We thank Mike Stekelenburg and Bill Anderson for their efforts during the design and installation of the UEM2 microscope and Tony Carpenter for his timely support. We are also grateful to Dr. Vladimir Lobastov for helpful discussions, Dr. William Tivol for his interest and supply of some TEM samples, and Prof. Eberhard Riedle and Dr. Peter Baum for providing a specially designed tripling crystal.
Published - nl071369q.pdf