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Published February 2005 | public
Journal Article

Light-free magnetic resonance force microscopy for studies of electron spin polarized systems


Magnetic resonance force microscopy is a scanned probe technique capable of three-dimensional magnetic resonance imaging. Its excellent sensitivity opens the possibility for magnetic resonance studies of spin accumulation resulting from the injection of spin polarized currents into a para-magnetic collector. The method is based on mechanical detection of magnetic resonance which requires low noise detection of cantilever displacement; so far, this has been accomplished using optical interferometry. This is undesirable for experiments on doped silicon, where the presence of light is known to enhance spin relaxation rates. We report a non-optical displacement detection scheme based on sensitive microwave capacitive readout.

Additional Information

© 2004 Elsevier B.V. Available online 4 November 2004. This work was supported by the Army Research Office through Grant DAAD 19-02-1-0310 and the Defense Advanced Research Projects Agency through the MOSAIC program.

Additional details

August 22, 2023
October 18, 2023