Published June 20, 2020 | Version public
Journal Article

Resolving micron-scale heterogeneity in porewater δ³⁴S_(H₂S) by combining films for in-situ sulfide capture and secondary ion mass spectrometry

  • 1. ROR icon Washington University in St. Louis
  • 2. ROR icon Rutgers, The State University of New Jersey
  • 3. ROR icon California Institute of Technology
  • 4. ROR icon Johns Hopkins University

Abstract

Sulfur cycling is ubiquitous in marine sedimentary environments and is influenced by microbial and abiotic processes that alter both the abundance and isotopic composition of sulfur species that can ultimately be captured as sedimentary minerals. Microbial metabolisms that generate sulfur isotopic (δ³⁴S) signatures in hydrogen sulfide have a spatial distribution that varies on the micron scale, yet porewater hydrogen sulfide is most often measured in bulk samples representing much larger volumes. This mismatch of scales can lead to erroneous or non-unique interpretations of biogeochemical processes and environmental conditions. Recently, an in-situ film-based technique was described that captures dissolved sulfide (H₂S) in porewaters and which can be subsectioned to reconstruct the δ³⁴S_(H₂S) profiles on the sub-cm scale within sediments. Here, we investigate the use of a Cameca 7f-GEO secondary ion mass spectrometer (SIMS) to analyze the δ³⁴S_(H₂S) captured from porewaters on these films on even smaller spatial scales and particularly in films with low sulfide abundance that could not otherwise be processed with bulk extraction techniques. We present a best-practice method for film analysis that minimizes analytical artifacts from varying sulfide abundance and interactions with silver halide nanocrystals imbedded in the organic-based film amalgam. This method was tested on several films from field deployments, including examples with heterogeneities on small (~100 μm) scales, steep isotopic gradients, and very low sulfide abundance across the sediment-water interface. The results demonstrate that analysis using SIMS can accurately measure δ³⁴S of in-situ sulfide captured by film with high precision (1σ ~ 0.3‰) in both spot and image modes and that the film itself can accurately record δ³⁴S variability down to 25 μm spatial resolution, below which physical limitations of the film can create artifacts.

Additional Information

© 2020 Elsevier B.V. Received 19 December 2019, Revised 20 April 2020, Accepted 21 April 2020, Available online 28 April 2020.

Additional details

Identifiers

Eprint ID
102905
Resolver ID
CaltechAUTHORS:20200429-124352121

Funding

NSF
EAR-1124389
Gordon and Betty Moore Foundation
GBMF3306
Caltech
Department of Energy (DOE)
DE-SC0014613

Dates

Created
2020-04-29
Created from EPrint's datestamp field
Updated
2021-11-16
Created from EPrint's last_modified field

Caltech Custom Metadata

Caltech groups
Division of Geological and Planetary Sciences (GPS), Division of Biology and Biological Engineering (BBE)