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Published December 2004 | Published
Journal Article Open

High total dose tolerance of prototype silicon nanocrystal non-volatile memory cells


We report the first results pertinent to the high total dose tolerance of Si nanocrystal nonvolatile memory cells. The studied prototype nc-Si field effect transistors made by ion implantation retained virtually unchanged write/erase characteristics, typical for the two-state devices, to cumulative doses exceeding 15Mrad(Si).

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© 2004 IEEE. "Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." Manuscript received July 20, 2004; revised September 1, 2004. Posted online: 2004-12-20. This work was supported by Intel, the Jet Propulsion Laboratory, California Institute of Technology under a contract with the National Aeronautics and Space Administration.

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