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Published July 1996 | Published
Journal Article Open

Analytical and experimental investigations of dual‐plane particle image velocimetry


In its classical form particle image velocimetry (PIV) extracts two components of the flow velocity vector by measuring the displacement of tracer particles within a double‐pulsed laser light sheet. The method described in this paper is based on the additional recording of a third exposure of the tracer particles in a parallel light sheet, which is slightly displaced with respect to the first one. The particle images resulting from these three exposures are stored on separate frames. The locations of the correlation peaks, as obtained by cross‐correlation methods, are used to determine the projections of the velocity vectors onto the plane between the two light sheets. The amplitudes of these peaks are used to obtain information about the velocity component perpendicular to the light‐sheet planes. The mathematical background of this method is described. Numerical simulations show the influence of the main parameters (e.g., light‐sheet thickness, light‐sheet displacement and out‐of‐plane flow component) on the resolution and reliability of the new method. A new recording procedure and its results will be shown to demonstrate the ease of operation when applying this technique to liquid flows.

Additional Information

© 1996 Society of Photo-Optical Instrumentation Engineers. Paper 03075 received July 17, 1995; revised manuscript received Dec. 6, 1995; accepted for publication Dec. 6, 1995. This paper is a revision of a paper presented at the SPIE conference on Optical Techiques in Fluid, Thermal, and Combustion Flow, July 1995, San Diego, CA. The paper presented there appears (unrefereed) in SPIE Proceedings Vol. 2546. The authors would like to thank DLR for supporting Markus Raffel's visit to Caltech (CQV), and the Office of Naval Research through the URI grant ONR-URI-N00014-92-J-1610. The research of J. Westerweel has been made possible by a fellowship of the Royal Netherlands Academy of Arts and Sciences.

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August 22, 2023
August 22, 2023