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Number of items: 1. Nemiroff, M. and Speriosu, V. S. (1985) X-ray study of low-temperature annealed arsenic-implanted silicon. Journal of Applied Physics, 58 (10). pp. 3735-3738. ISSN 0021-8979. doi:10.1063/1.335638. https://resolver.caltech.edu/CaltechAUTHORS:NEMjap85 |