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Grunthaner, P. J. and Grunthaner, F. J. and Scott, D. M. et al. (1981) Oxygen impurity effects at metal/silicide interfaces: Formation of silicon oxide and suboxides in the Ni/Si system. Journal of Vacuum Science and Technology, 19 (3). pp. 641-648. ISSN 0022-5355. doi:10.1116/1.571078.

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