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Yu, E. T. and Phillips, M. C. and McCaldin, J. O. et al. (1991) Measurement of the CdSe/ZnTe valence band offset by x-ray photoelectron spectroscopy. Journal of Vacuum Science and Technology B, 9 (4). pp. 2233-2237. ISSN 1071-1023. http://resolver.caltech.edu/CaltechAUTHORS:YUEjvstb91

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