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Ting, D. Z.-Y. and McGill, T. C. (1998) Effects of interface roughness and conducting filaments in metal–oxide–semiconductor tunnel structures. Journal of Vacuum Science and Technology B, 16 (4). pp. 2182-2187. ISSN 1071-1023. doi:10.1116/1.590297. https://resolver.caltech.edu/CaltechAUTHORS:TINjvstb98

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