A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Ting, D. Z.-Y. and McGill, T. C. (1998) Effects of interface roughness and conducting filaments in metal–oxide–semiconductor tunnel structures. Journal of Vacuum Science and Technology B, 16 (4). pp. 2182-2187. ISSN 1071-1023. http://resolver.caltech.edu/CaltechAUTHORS:TINjvstb98

This list was generated on Sat Sep 21 17:41:04 2019 PDT.

CaltechAUTHORS is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.