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Liu, W. S. and Lee, E. W. and Nicolet, M-A. et al. (1992) Importance of sample preheating in oxidation of GexSi1−x. Journal of Applied Physics, 71 (7). pp. 3626-3627. ISSN 0021-8979. doi:10.1063/1.350922. https://resolver.caltech.edu/CaltechAUTHORS:LIUjap92a

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