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Okamoto, Koichi and Scherer, Axel and Kawakami, Yoichi (2005) Near-field scanning optical microscopic transient lens for carrier dynamics study in InGaN/GaN. Applied Physics Letters, 87 (16). Art. no. 161104. ISSN 0003-6951. doi:10.1063/1.2105999. https://resolver.caltech.edu/CaltechAUTHORS:OKAapl05a

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