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Hauenstein, R. J. and Clemens, B. M. and Miles, R. H. et al. (1989) Strain relaxation kinetics in Si1–xGex/Si heterostructures. Journal of Vacuum Science and Technology B, 7 (4). pp. 767-774. ISSN 1071-1023. doi:10.1116/1.584598. https://resolver.caltech.edu/CaltechAUTHORS:HAUjvstb89

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