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Hauenstein, R. J. and Schlesinger, T. E. and McGill, T. C. et al. (1986) Schottky barrier height measurements of type-A and type-B NiSi2 epilayers on Si. Journal of Vacuum Science and Technology A, 4 (3). pp. 860-864. ISSN 0734-2101. doi:10.1116/1.573796. https://resolver.caltech.edu/CaltechAUTHORS:HAUjvsta86

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