A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Hauenstein, R. J. and Schlesinger, T. E. and McGill, T. C. et al. (1986) Schottky barrier height measurements of type-A and type-B NiSi2 epilayers on Si. Journal of Vacuum Science and Technology A, 4 (3). pp. 860-864. ISSN 0734-2101. http://resolver.caltech.edu/CaltechAUTHORS:HAUjvsta86

This list was generated on Fri Jan 18 21:35:27 2019 PST.

CaltechAUTHORS is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.