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Kao, Y. C. and Wang, K. L. and de Fresart, E. et al. (1987) Study of CoSi2/Si strained layers grown by molecular beam epitaxy. Journal of Vacuum Science and Technology B, 5 (3). pp. 745-748. ISSN 1071-1023. doi:10.1116/1.583781. https://resolver.caltech.edu/CaltechAUTHORS:KAOjvstb87

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