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Hoenk, Michael E. and Chen, Howard Z. and Yariv, Amnon et al. (1989) Cathodoluminescence measurement of an orientation dependent aluminum concentration in AlxGa1−xAs epilayers grown by molecular beam epitaxy on a nonplanar substrate. Applied Physics Letters, 54 (14). pp. 1347-1349. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:HOEapl89a

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