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Hoh, Jan H. and Revel, Jean-Paul and Hansma, Paul K. (1991) Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass. Nanotechnology, 2 (3). pp. 119-122. ISSN 0957-4484. doi:10.1088/0957-4484/2/3/003.

This list was generated on Fri Dec 9 17:27:29 2022 UTC.