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Hoh, Jan H. and Revel, Jean-Paul and Hansma, Paul K. (1991) Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass. Nanotechnology, 2 (3). pp. 119-122. ISSN 0957-4484.

This list was generated on Mon Oct 18 21:34:45 2021 UTC.