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Chueh, William C. and Haile, Sossina M. (2009) Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities. Physical Chemistry Chemical Physics, 11 (37). pp. 8144-8148. ISSN 1463-9076. http://resolver.caltech.edu/CaltechAUTHORS:20090925-095034779

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