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Xu, Ke and Cao, Peigen and Heath, James R. (2009) Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers. Nano Letters, 9 (12). pp. 4446-4451. ISSN 1530-6984.

This list was generated on Wed Oct 18 22:38:24 2017 PDT.