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Lee, T. F. and McGill, T. C. (1973) Semiempirical calculation of deep levels: divacancy in Si. Journal of Physics C: Solid State Physics, 6 (23). pp. 3438-3450. ISSN 0022-3719. doi:10.1088/0022-3719/6/23/017. https://resolver.caltech.edu/CaltechAUTHORS:LEEjpc73

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