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Wong, Joyce and Scherer, Axel and Todorovic, Mladen et al. (1999) Fabrication and characterization of high aspect ratio perpendicular patterned information storage media in an Al2O3/GaAs substrate. Journal of Applied Physics, 85 (8). pp. 5489-5491. ISSN 0021-8979. doi:10.1063/1.369871. https://resolver.caltech.edu/CaltechAUTHORS:WONjap99

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