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Ngo, D. and Feng, X. and Huang, Y. et al. (2007) Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. Part I: Analysis for obtaining film stress from non-local curvature information. International Journal of Solids and Structures, 44 (6). pp. 1745-1754. ISSN 0020-7683. http://resolver.caltech.edu/CaltechAUTHORS:20100924-103650164

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