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Brongersma, M. L. and Polman, A. and Min, K. S. et al. (1999) Depth distribution of luminescent Si nanocrystals in Si implanted SiO2 films on Si. Journal of Applied Physics, 86 (2). pp. 759-763. ISSN 0021-8979. doi:10.1063/1.370800. https://resolver.caltech.edu/CaltechAUTHORS:BROjap99

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