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Weimer, M. and Kramar, J. and Bai, C. et al. (1988) Tunneling microscopy of 2H-MoS2: A compound semiconductor surface. Physical Review B, 37 (8). pp. 4292-4295. ISSN 0163-1829. doi:10.1103/PhysRevB.37.4292. https://resolver.caltech.edu/CaltechAUTHORS:WEIprb88.993

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