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Michalak, David J. and Lewis, Nathan S. (2002) Use of near-surface channel conductance and differential capacitance versus potential measurements to correlate inversion layer formation with low effective surface recombination velocities at n-Si/liquid contacts. Applied Physics Letters, 80 (23). pp. 4458-4460. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:MICapl02

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