| Login |
Browse by Eprint ID
Number of items: 1. Michalak, David J. and Lewis, Nathan S. (2002) Use of near-surface channel conductance and differential capacitance versus potential measurements to correlate inversion layer formation with low effective surface recombination velocities at n-Si/liquid contacts. Applied Physics Letters, 80 (23). pp. 4458-4460. ISSN 0003-6951. https://resolver.caltech.edu/CaltechAUTHORS:MICapl02 |
