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Bridger, P. M. and Bandić, Z. Z. and Piquette, E. C. et al. (1999) Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy. Applied Physics Letters, 74 (23). pp. 3522-3524. ISSN 0003-6951. https://resolver.caltech.edu/CaltechAUTHORS:BRIapl99

This list was generated on Tue Oct 15 17:59:03 2019 PDT.