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Bridger, P. M. and Bandić, Z. Z. and Piquette, E. C. et al. (1998) Correlation between the surface defect distribution and minority carrier transport properties in GaN. Applied Physics Letters, 73 (23). pp. 3438-3440. ISSN 0003-6951. doi:10.1063/1.122790. https://resolver.caltech.edu/CaltechAUTHORS:BRIapl98

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