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Jones, J. T. and Bridger, P. M. and Marsh, O. J. et al. (1999) Charge storage in CeO2/Si/CeO2/Si(111) structures by electrostatic force microscopy. Applied Physics Letters, 75 (9). pp. 1326-1328. ISSN 0003-6951. doi:10.1063/1.124682. https://resolver.caltech.edu/CaltechAUTHORS:JONapl99

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