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Stein, B. L. and Yu, E. T. and Croke, E. T. et al. (1997) Band offsets in Si/Si1–x–yGexCy heterojunctions measured by admittance spectroscopy. Applied Physics Letters, 70 (25). pp. 3413-3415. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:STEapl97

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